PinPoint 3-PXIe

Component-level diagnostics and high-performance functional testing in one system

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Description

Built on Performance

The PinPoint 3-PXIe combines over 30 years of development of the PinPoint Circuit Card diagnostic system with industry standard PXIe technology. PinPoint provides a comprehensive suite of tools for identifying failures down to the component level, while PXIe provides access to countless instruments that can be used to test a wide range of mixed signal products. The PinPoint 3-PXIe is the ideal solution for addressing unlimited test applications and troubleshooting to the component level, all from one system.

Supporting Legacy Equipment

  • Test coverage to support aging testers
  • Low cost rehosting capability from obsolete testers
  • Tech data created for undocumented circuits
  • Multi-level test strategy
  • Functional testing from the edge connector
  • Diagnostics to the component level
  • Comprehensive fault coverage
  • Rapid program development

Key Features

PXIe 9-slot chassis (8 hybrid slots), features an all-hybrid backplane to meet a wide range of high-performance test and measurement application needs. Hybrid slots for instrumentation flexibility = compatibility with PXI, PXIExpress, CompactPCI, and CompactPCI Express modules. Performance—up to 8 GB/s system and 2 GB/s per-slot dedicated bandwidth.

Customizable for Your Test Needs

The P3-PXIe can be configured from a comprehensive selection of COTS instruments, power supplies and switches, making it an ideal test solution for a wide range of avionics, weapon system controls, and electronic assemblies.

High-Speed Digital I/O with the PXIe-6943

The PXIe-6943 provides the basis for a complete state-of-the-art digital solution at the subsystem level and is the ideal solution for both legacy digital replacement and new digital test stations for applications including aircraft/ avionics, weapons systems, spacecraft, semiconductors, medical devices, and more. Adding the Astronics PXIe-6943 digital I/O provides high speed functional test capability that can replicate and replace legacy test sets.

  • Integration of the PXIe-6943 supports functional edge testing of Digital I/O up to 50MHz.
  • Suitable for legacy or new applications
  • Software for converting ATLAS based TPS & more

A “Ready For Issue” (RFI) Solution

With the PinPoint 3-PXIe, you can achieve full functional test coverage for a wide range of Circuit Card Assemblies (CCA). Screening items that are suspect (i.e. ambiguity call out from the LRU test) reduces the number of No Fault Found (NFF) items and significantly lowers support costs. Additionally, having the ability to test an asset after it has been repaired shortens the repair cycle and reduces the demand on inventory.

KEY BENEFITS

  • SWPC Savings – Diagnostics and full functional test in one system saves space, weight, power, and cost
  • Maximize ROI – Suitable for legacy and modern technology
  • Keep Assets in Service – Significantly reduce the number of No Fault Found (NFF)
  • Control System Maintenance – Reduce dependence on OEMs, shorten repair cycle, lower maintenance cost
  • Easy Transition – low cost rehosting capability
  • Versatility – can be used on virtually any type of circuit card

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